Second order (IV Formative DV Reflective) measurement

Questions about the implementation and application of the PLS-SEM method, that are not related to the usage of the SmartPLS software.
Post Reply
GDAVE
PLS Junior User
Posts: 8
Joined: Sun Jun 29, 2008 4:43 pm
Real name and title:

Second order (IV Formative DV Reflective) measurement

Post by GDAVE »

Hello,
I have a DV, which is a second order construct in reflective mode.

My IV is also a second order construct, but in the formative mode (The first order constructs of this IV are reflective)

I was wondering if I should use repeated indicator approach to model the DV and use LV approach (by running principal components analysis for the 1st order LV and using the scores as measures) .

OR
Should I use the LV approach for both constructs instead of mixing the two?

Please help

Thanks
George
User avatar
Diogenes
PLS Super-Expert
Posts: 899
Joined: Sat Oct 15, 2005 5:13 pm
Real name and title:
Location: São Paulo - BRAZIL
Contact:

Post by Diogenes »

Hi George,
both of them will be ok.
Best regards.
Bido
GDAVE
PLS Junior User
Posts: 8
Joined: Sun Jun 29, 2008 4:43 pm
Real name and title:

Post by GDAVE »

Thanks Dr. Bido
Post Reply